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Springerbriefs in Physics Ser.: Photo-Excited Charge Collection Spectroscopy : Probing the Traps in Field-Effect Transistors by Seongil Im, Youn-Gyoung Chang and Jae Hoon Kim (2013, Trade Paperback)
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ISBN-13: 9789400763913, 978-9400763913. Solid state field-effect devices such as organic and inorganic-channel thin-film transistors (TFTs) have been expected to promote advances in display and sensor electronics.
- Compralo SubitoPhoto-Excited Charge Collection Spectroscopy - 9789400763913
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Informazioni su questo prodotto
Product Identifiers
PublisherSpringer Netherlands
ISBN-109400763913
ISBN-139789400763913
eBay Product ID (ePID)141463880
Product Key Features
Number of PagesXi, 101 Pages
Publication NamePhoto-Excited Charge Collection Spectroscopy : Probing the Traps in Field-Effect Transistors
LanguageEnglish
SubjectPhysics / Condensed Matter, Physics / Optics & Light, Materials Science / Thin Films, Surfaces & Interfaces, Electronics / Circuits / General, Electronics / Transistors
Publication Year2013
TypeTextbook
Subject AreaTechnology & Engineering, Science
AuthorSeongil Im, Youn-Gyoung Chang, Jae Hoon Kim
SeriesSpringerbriefs in Physics Ser.
FormatTrade Paperback
Dimensions
Item Height0.1 in
Item Weight66.4 oz.
Item Length9.3 in
Item Width6.1 in
Additional Product Features
Intended AudienceScholarly & Professional
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