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Quantitative X-Ray Spectrometry
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- Compralo SubitoQuantitative X-Ray Spectrometry
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Oggetto che si trova a: Rainsville, Alabama, Stati Uniti
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Consegna prevista tra il sab 2 ago e il gio 7 ago a 94104
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Numero oggetto eBay:203236643734
Specifiche dell'oggetto
- Condizione
- ISBN
- 9780824795542
Informazioni su questo prodotto
Product Identifiers
Publisher
CRC Press LLC
ISBN-10
0824795547
ISBN-13
9780824795542
eBay Product ID (ePID)
1061955
Product Key Features
Number of Pages
504 Pages
Publication Name
Quantitative X-Ray Spectrometry
Language
English
Publication Year
1995
Subject
Spectroscopy & Spectrum Analysis, Chemistry / Industrial & Technical, Chemistry / General
Type
Textbook
Subject Area
Science
Series
Practical Spectroscopy Ser.
Format
Hardcover
Dimensions
Item Height
1.3 in
Item Weight
38.6 Oz
Item Length
9.5 in
Item Width
6.5 in
Additional Product Features
Edition Number
2
Intended Audience
Scholarly & Professional
LCCN
95-004073
Reviews
"International praise for the previous edition. . . . . .critically describes x-ray instrumentation and techniques. . .has one of the most extensive discussions of energy-dispersive x-ray spectrometry of any book. " ---Analytical Chemistry ". . .a valuable compendium for the practicing x-ray spectroscopist in industry and science or researchers in other fields who have to apply x-ray analysis. " ---Journal of Applied Crystallography "Ron Jenkins could. . .be described as the doyen of XRF and together with his colleagues R. W. Gould and Dale Gedcke brings vast wealth of experience to the subject of XRF. . .. . . .the main revisions to this second edition are the inclusion of details of layered synthetic microstructures, total reflection X-ray spectrometry, and the influence of the personal computer. . ..an important contribution to XRF and will be of interest to both new and established workers in this field. " ---Journal of Analytical Atomic Spectrometry
Series Volume Number
Vol. 20
Illustrated
Yes
Volume Number
Vol. 20
Edition Description
Revised edition,New Edition
Table Of Content
The interaction of X-rays with matter; sources for the excitation of characteristic X-rays; instrumentation; statistics; general computer applications and quantitative spectrum analysis as applied to energy-dispersive analysis; specimen preparation; qualitative analysis; basic problems in quantitative analysis; methods and models for quantitative analysis; trace analysis; radiation health hazards in X-ray spectrometry; applications of X-ray spectrometry. Appendices: no-menclature; mass absorption coefficients; conversions and physical constants; atomic weights and densities; wavelengths and energies; wavelength tables for K, L, and M series.
Synopsis
This work covers important aspects of X-ray spectrometry, from basic principles to the selection of instrument parameters and sample preparation. This edition explicates the use of combined X-ray fluorescence and X-ray diffraction data, and features new applications in environmental studies, forensic science, archeometry and the analysis of metals and alloys, minerals and ore, ceramic materials, catalysts and trace metals.;This work is intended for spectroscopists, analytical chemists, materials scientists, experimental physicists, mineralogists, biologists, geologists and graduate-level students in these disciplines.
LC Classification Number
QD96.X2J46 1995
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